By Bruce A. Tuttle, Chonglin Chen, Quanxi Jia, R. Ramesh
Advances in synthesis and characterization of dielectric, piezoelectric and ferroelectric skinny motion pictures are integrated during this quantity. Dielectric, piezoelectric and ferroelectric skinny movies have an incredible effect on various advertisement and armed forces platforms together with tunable microwave units, thoughts, MEMS units, actuators and sensors. contemporary paintings on piezoelectric characterization, AFE to FE dielectric part transformation dielectrics, answer and vapor deposited skinny motion pictures, and fabrics integration are one of the subject matters integrated. Novel ways to nanostructuring, characterization of fabric homes and actual responses on the nanoscale is also included.Content:
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Additional resources for Advanced Dielectric, Piezoelectric and Ferroelectric Thin Films, Volume 162
The diameter of these particles was of the order of 25-30 nm, and there were no external features in their topography. They were mechanically very stable, since they remained at their positions even after repeated AFM scans, leading to a belief that they are the parts of the film. , the off oriented grains which were present even in a thick film as evident from figure 1. More systematic analysis with the help of TEM and XPS measurements are underway and high resolution XRD measurements are in our plan.
Oscillation level of 50 mV. The leakage currents were recorded using an HP4339B high resistance meter using a voltage step technique that consisted of stepping the voltage in equally spaced voltage increments up to the maximum value. A hold time of 100 seconds was used between each voltage step after which the leakage was recorded. Time dependent dielectric breakdown (TDDB) and leakage currents were recorded using an Kiethley 2400 source meter. RESULTS AND DISCUSSION BST Microstructure Figure 1 shows a cross sectional TEM image of a Pt/BST/Pt thin film capacitor.
Jang, "A study of grain size dependent ferroelectric properties of annealed amorphous Bi4Ti30i2," / Korean Phys. Soc, 35  S1465S1468 (1999) ll S. Kojima and S. Shimada, "Soft mode spectroscopy of bismuth titanate single crystals," PhysicaB, 219 & 220 617-619 (1996) l2 R. Zallen and M. Slade, "Rigid-layer modes in chalcogenide crystals," Phys. Rev. B, 9  1627-1637(1974) I3 S. Kojima, R. Imaizum, S. Hamazaki, and M. Takashige, "Raman scattering study of bismuth layer-structure ferroelectrics," Jpn.
Advanced Dielectric, Piezoelectric and Ferroelectric Thin Films, Volume 162 by Bruce A. Tuttle, Chonglin Chen, Quanxi Jia, R. Ramesh